---
kind: "section"
citation: "40 C.F.R. § 63.5989"
title: "40"
number: "63.5989"
heading: "What are my alternatives for meeting the emission limitations for puncture sealant application affected sources?"
url: "https://uscodex.org/cfr/40/63.5989"
---

# §63.5989. What are my alternatives for meeting the emission limitations for puncture sealant application affected sources?


You must use one of the compliance alternatives in [paragraphs (a) through (d)](#a..d) of this section to meet the emission limitations in [§ 63.5988](/cfr/40/63.5988.md).

- (a) **Overall control efficiency alternative.** Use an emissions capture system and control device and demonstrate that the application booth emissions meet the emission limits in table 3 to this subpart, option 1a or 1b, and the control device and capture system meet the operating limits in table 4 to this subpart.
- (b) **Permanent total enclosure and control device efficiency alternative.** Use a permanent total enclosure that satisfies the Method 204 criteria in [40 CFR part 51](/cfr/40/part51.md), appendix M. Demonstrate that the control device meets the emission limits in table 3 to this subpart, option 1a or 1b. You must also show that the control device and capture system meet the operating limits in table 4 to this subpart.
- (c) **Monthly average alternative, without using an add-on control device.** Use puncture sealants in such a way that the monthly average HAP emissions do not exceed the emission limits in table 3 to this subpart, option 2.
- (d) **Monthly average alternative, using an add-on control device.** Use a control device to reduce HAP emissions so that monthly average HAP emissions do not exceed the emission limits in table 3 to this subpart, option 2.

## Notes

### Source

Source: 67 FR 45598, July 9, 2002, unless otherwise noted.

### Authority

Authority: 42 U.S.C. 7401 et seq.

### Source

Source: 57 FR 61992, Dec. 29, 1992, unless otherwise noted.